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              1. IEC62368 test probe kit BND-TPK08

                Product Description:BND-TPK08 IEC62368-1:2010 test probe kitstandard:IEC62368-1:20101. Figure V.1 – Jointed test probe for equipment likely to be accessible to children2. Figure V.2 – Jointed test probe for equipment not likely to be accessible to children3. Figure V.3 – Blunt probe4. Figure V.4 – Wedge probe
                Description

                Product Description:

                BND-TPK08 IEC62368-1:2010 test probe kit

                standard:IEC62368-1:2010


                1. Figure V.1 – Jointed test probe for equipment likely to be accessible to children

                2. Figure V.2 – Jointed test probe for equipment not likely to be accessible to children

                3. Figure V.3 – Blunt probe

                4. Figure V.4 – Wedge probe

                5. Figure V.5 – Terminal probe


                Products drawing and pictures:

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                DQnGi
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